About This Product
This Metric Thickness Gage Reticle is very suitable for critical line width and spacing measurements. The pattern contains 15 line widths from .02mm to .10mm in 0.01mm increments, 0.15, 0.20, 0.25, 0.30, 0.35, and 0.40 mm. The pattern line width is 0.025mm ±0.0025mm.
The pattern is right reading looking through the glass so that the pattern can be in direct contact with the object to be measured. The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions.
For a listing of Magnifiers that can be used with this reticle see the Magnifier/Comparator to Reticle matrix under ”Detailed Specifications”.