About This Product
Microscope Calibration Reticles are generally inserted in the optical path of a Microscope between the the Microscope Objective and the Eyepiece. These reticles are scaled to match the power of the Objective, thus providing direct reading of the part to be measured. The accuracy of the measurement will be a function of both the true magnification of the Microscope Objective and the Calibration Reticle.
The 3X Microscope Calibration Reticle can be used with a 3X objective for direct reading measurements.
The 3X calibration reticle is useful for linear measurements and has an overall accuracy of 1μ over the 10mm length. The pattern is Low Reflection Chrome looking through the substrate. The substrate is 1.5mm thick stable optical quality glass.
The reticle pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The patterns on all reticles manufactured by Max Levy are replicated from precision Chrome on Glass tooling under clean room conditions.
To qualify the combination of Microscope Objective and Calibration Reticle use the .001”/.025mm division MicroRule
and compare the readings between the direct reading Microrule or Microscale and the projected image of the Microscope Calibration Reticle.
For a listing of magnifiers that can be used with this reticle, see the Magnifier/Comparator to Reticle matrix
under “Detailed Specifications”.