This Metric Thickness Gauge Reticle is very suitable for critical line width and spacing measurements. It has line widths of .04 to .010mm in .01mm increments and line widths of .015mm to .40mm in .05mm increments. All line widths have a tolerance of ± .0001” (.0025mm). It is also ideal for measure dot gain on printed sheet stock, inclusions and scratches on film and other types of sheet stock.
The Pattern is right reading looking through the glass so that the pattern can be in direct contact with the object to be measured. The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern.
The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions.
For a listing of Magnifiers that can be used with this reticle see the Magnifier/Comparator to Reticle matrix under “Detailed Specifications”.