This Reticle is used for determining coordinate locations in X and Y and for the evaluation of matrix hole and line patterns. It is also useful as a simple stand-alone pattern for evaluating Machine Vision Camera System Optics for barreling and pincushion distortion.
The Pattern is a 10 X 10 Matrix of .05” Squares with Numerical Column and Lettered Row markings. Pattern Line Widths are .001”±.0001”.
The Pattern is right reading looking through the glass so that the pattern can be in direct contact with the object to be measured.
The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions.
For a listing of Magnifiers that can be used with this reticle see the Magnifier/Comparator to Reticle matrix under “Detailed Specifications”.