Custom Measurement Devices

Max Levy Autograph (MLA) produces a wide array of custom products to meet high precision metrology needs including MicroRules, Microscales, High Precision Grid and Dot Arrays, Reticles, Gray Scale Targets, Machine Vision Scales, and Clear Optical Paths.

MLA’s capabilities cover the UV-VIS-IR and X-Ray spectrums. A wide variety of metals (Al, Au, Ag, Cr, Cu, Ni, Pt, Sn) and dielectrics can be patterned on an assortment of substrates ranging from glass, to sapphire, to multispectral materials in which submicron features and alignments are typical. Overall dimensions range from 1mm x 1mm to 3.0m x 2.0m.

Custom measurement devices can be requested here.

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