This English and Metric micrometer reticle is used for critical measurements of object features. The English scale measures -0.45” to + 0.45” in 0.001” increments. The metric scale measures -12mm to +12mm in 0.025mm increments. The pattern line width is 0.0002” ±0.00004” (0.005mm ± 0.001mm). The pattern has an overall accuracy of 0.00004” (0.001mm).
The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions.
For a listing of Magnifiers that can be used with this reticle see the Magnifier/Comparator to Reticle matrix under ”Detailed Specifications”.