Reticle 35mm Calibration Rule .001In/.025mm
    Close Reticle 35mm Calibration Rule .001In/.025mm

    Reticle 35mm Calibration Rule .001In/.025mm

    Stock No. AA072

    Price As Low As: $80.55

    Quantity Price Each
    1-5 $89.50
    5+ $80.55

    About This Product

    This English and Metric micrometer reticle is used for critical measurements of object features. The English scale measures 0 to 0.90” in 0.001” increments. The Metric scale measures 0 to 23mm in 0.025mm increments. The pattern line width is 0.0002” ±0.00004” (0.005mm ± 0.001mm). The pattern has an overall accuracy of 0.00004” (0.001mm).

    The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions.

    For a listing of Magnifiers that can be used with this reticle see the Magnifier/Comparator to Reticle matrix under ”Detailed Specifications”.
    Pacific Rare Specialty Metals & ChemicalsLightWorks Optical SystemsII-VI Incorporated

    Copyright © 2018 Max Levy Autograph, Inc.

    Site Design and Development by Miva Merchant Professional Services